01
Inspecting 200 lots
0 / 1,000 inspection decisions
Classifying defect map0 / 200
Scoring yield risk0 / 200
Deciding disposition0 / 200
Setting handling0 / 200
Checking queue time0 / 200
Two hundred wafer lots are queued for eight lithography scanners at the start of a 12-hour shift. Scheduling them requires reading each lot’s defect map image, measurements, and shop-floor notes to decide whether it is safe to run and which scanner it can use. Engineers can’t review 200 lots in time, and schedulers can’t read images or free text. Bivia evaluates every lot in seconds, holds the risky ones back, and schedules the rest across the eight scanners.
0 / 1,000 inspection decisions
0 dispatch decisions
Lots on hold or rework stay out of the queue. As each scanner frees up, Bivia picks which lot runs next.